Lavagno, Luciano.

Electronic design automation for IC system design, verification, and testing [electronic resource] / Luciano Lavagno, Igor L. Makrov, Grant Martin, Louis K. Scheffer. - Boca Raton, Florida : CRC Press, 2016. - 1 online resource.

Includes bibliographical references.

1: Overview -- 2: Integrated Circuit Design Process and Electronic Design Automation -- II: System-Level Design -- 3: Tools and Methodologies for System-Level Design -- 4: System-Level Specification and Modeling Languages -- 5: SoC Block-Based Design and IP Assembly -- 6: Performance Evaluation Methods for Multiprocessor System-on-Chip Designs -- 7: System-Level Power Management -- 8: Processor Modeling and Design Tools 9: Models and Tools for Complex Embedded Software and Systems -- 10: Using Performance Metrics to Select Microprocessor Cores for IC Designs -- 11: High-Level Synthesis -- III: Microarchitecture Design -- 12: Back-Annotating System-Level Models -- 13: Microarchitectural and System-Level Power Estimation and Optimization -- 14: Design Planning -- IV: Logic Verification -- 15: Design and Verification Languages -- 16: Digital Simulation -- 17: Leveraging Transaction-Level Models in an SoC Design Flow -- 18: Assertion-Based Verification -- 19: Hardware-Assisted Verification and Software Development 20: Formal Property Verification -- V: Test -- 21: Design-for-Test -- 22: Automatic Test Pattern Generation -- 23: Analog and Mixed-Signal Test.

Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more.


Integrated circuits--Computer-aided design.
Integrated circuits--Design and construction.
Integrated circuits--Testing.